TEST CHIP for the IEEE 1149.4 Standard

The 1149.4 test chip is intended to test various features of the Dot4 standard on real silicon and on a real test board. The test chip contains:

A 1149.1 four wire interface, with the optional RSTB pin.
A digital input and output pin.
Pins bringing out VH, VL, and Compare levels for external control. These are normally tied to supply rails on chip.
A differential set of Dot4 force and sense lines.
Five different types of Dot4 boundary cell
Two 100MHz differential amplifiers, one with Dot4 cells, one connected straight to pins. These are the large rectangles in the middle of the drawing.
Optional high speed differential comparators per pin.
Internal analog probe points.
Internal analog device measurement cells.

The test chip is a 4.0 x 2.5 mm, 40 pin IC fabricated in IMP Semiconductor 's 1.2 micron dual metal N-well CMOS process.

Unfortunately, samples of the test chips are no longer available. Matsushita also built a test chip, and those are used up, too. It's about time for academia to build another one.

This chip generated two papers at the 1996 ITC.

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last revision Jan 11, 2013