TEST CHIP for the IEEE 1149.4 Standard

The 1149.4 test chip is intended to test various features of the Dot4 standard on real silicon and on a real test board. The test chip contains: The test chip is a 4.0 x 2.5 mm, 40 pin IC fabricated in IMP Semiconductor 's 1.2 micron dual metal N-well CMOS process.

Unfortunately, samples of the test chips are no longer available.   Matsushita also built a test chip, and those are used up, too.  It's about time for academia to build another one.

This chip generated two papers at the 1996 ITC.

KLIC - your ideas in silicon!


last revision Jan 11, 2013